首页> 外文OA文献 >Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy
【2h】

Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy

机译:调频原子力显微镜中力解卷积方法的分析

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

In frequency-modulation atomic force microscopy the direct observable is the frequency shift of an oscillating cantilever in a force field. This frequency shift is not a direct measure of the actual force, and thus, to obtain the force, deconvolution methods are necessary. Two prominent methods proposed by Sader and Jarvis (Sader–Jarvis method) and Giessibl (matrix method) are investigated with respect to the deconvolution quality. Both methods show a nontrivial dependence of the deconvolution quality on the oscillation amplitude. The matrix method exhibits spikelike features originating from a numerical artifact. By interpolation of the data, the spikelike features can be circumvented. The Sader–Jarvis method has a continuous amplitude dependence showing two minima and one maximum, which is an inherent property of the deconvolution algorithm. The optimal deconvolution depends on the ratio of the amplitude and the characteristic decay length of the force for the Sader–Jarvis method. However, the matrix method generally provides the higher deconvolution quality.
机译:在调频原子力显微镜中,可以直接观察到的是振荡悬臂在力场中的频移。该频移不是实际力的直接量度,因此,为了获得力,需要去卷积方法。关于反卷积质量,研究了Sader和Jarvis(Sader–Jarvis方法)和Giessibl(矩阵方法)提出的两种突出方法。两种方法均显示出反卷积质量对振荡幅度的非平凡依赖。矩阵方法展现出源自数字伪像的尖峰状特征。通过数据插值,可以规避尖峰状特征。 Sader-Jarvis方法具有连续的幅度依赖性,显示出两个最小值和一个最大值,这是解卷积算法的固有属性。最佳解卷积取决于Sader–Jarvis方法的振幅与力的特征衰减长度之比。然而,矩阵方法通常提供更高的去卷积质量。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号